Compact handheld probe for shifted excitation Raman difference spectroscopy with implemented dual-wavelength diode laser at 785 nanometers

Applied Spectroscopy

Volumn 69, Issue 10, 2015, Pages 1144-1151

  Maiwald, Martin ^a   Eppich, Bernd ^a   Ginolas, Arnim ^a   Sumpf, Bernd ^a   Erbert, Götz ^a   Tränkle, Günther ^a  

^a LEIBNIZ INSTITUT FÜR HÖCHSTFREQUENZTECHNIK   (Germany)

Author keywords

785 nm; Dual wavelength diode laser; Handheld probe; Raman spectroscopy; SERDS; Shifted excitation Raman difference spectroscopy

Indexed keywords

DIAGNOSIS; DIODES; FOOD SAFETY; PROBES; RAMAN SPECTROSCOPY; SEMICONDUCTOR LASERS; SHOT NOISE;

785 NM; DUAL WAVELENGTH; HANDHELDS; SERDS; SHIFTED EXCITATION RAMAN DIFFERENCE SPECTROSCOPIES;

LASER EXCITATION;

EID: 84960477876     PISSN: 00037028     EISSN: 19433530     Source Type: Journal    
DOI: 10.1366/15-07858     Document Type: Article

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