Characterization of the Over-Erase Algorithm in FN/FN Embedded nor Flash Arrays

IEEE Transactions on Device and Materials Reliability

Volumn 15, Issue 4, 2015, Pages 529-535

  Zambelli, Cristian ^a   Olivo, Piero ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

flash memories; fn fn; Over erase algorithm; reliability; soft programming

Indexed keywords

FLASH MEMORY; MEMORY ARCHITECTURE; OPTIMIZATION; RELIABILITY;

ERASE OPERATION; FN/FN; MEMORY RELIABILITY; OVER-ERASE; PERFORMANCE AND RELIABILITIES; PHYSICAL MECHANISM; SOFT PROGRAMMING; STATE-OF-THE-ART PROCEDURES;

ALGORITHMS;

EID: 84960452596     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2015.2478918     Document Type: Article

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