An automatic harmonic selection scheme based on spectrum analyzer measurements

60th ARFTG Conference Digest: Measurements Needs for Emerging Technologies, ARFTG 2002

Volumn , Issue , 2002, Pages 123-130

  Rabijns, D ^a   Vandersteen, G ^a   Rolain, Y ^a   Van Moer, W ^a   Geens, A ^a   Schoukens, J ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

measurement; non linearities; signal detection; spectrum analyzer; statistics

Indexed keywords

MEASUREMENTS; SIGNAL DETECTION; STATISTICS;

DETECTION ALGORITHM; MEASURED SIGNALS; PRIOR KNOWLEDGE; RESOLUTION BANDWIDTH; SELECTION SCHEME; SIMULATIONS AND MEASUREMENTS; SPECTRAL COMPONENTS; STATISTICAL FRAMEWORK;

SPECTRUM ANALYZERS;

EID: 84960343274     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTGF.2002.1218695     Document Type: Conference Paper

References (9)

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9. W. Van Moer, Y. Rolain and J. Schoukens. An automatic harmonic selection scheme for measurements and calibration with the Nonlinear Vectorial Network Analyzer, IEEE Transactions on Instrumentation and Measurement Technology, Vol. 51, No 2, pp 337-341, April 2002.