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Volumn , Issue , 2001, Pages 22-25
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Empirical studies to identify defect prevention opportunities using process simulation technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
DEFECTS;
NASA;
PROCESS ENGINEERING;
SOFTWARE ENGINEERING;
SOFTWARE TESTING;
TECHNICAL PRESENTATIONS;
DEFECT PREVENTION;
EMPIRICAL STUDIES;
MOTOROLA;
PROCESS IMPROVEMENT;
PROCESS MODELING AND SIMULATIONS;
PROCESS SIMULATIONS;
TECHNOLOGICAL CHANGE;
TEST QUALITY;
QUALITY CONTROL;
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EID: 84960341892
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/SEW.2001.992651 Document Type: Conference Paper |
Times cited : (2)
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References (8)
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