Scanning Electron Microscopy

Handbook of Microscopy: Applications in Materials Science , Solid-state Physics and Chemistry

Volumn , Issue , 2008, Pages 539-561

  Joy, David C ^a  

^a UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSED MATTER PHYSICS; MATERIALS SCIENCE;

SCANNING ELECTRON MICROSCOPY;

EID: 84960230527     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527620524.ch1     Document Type: Chapter

References (25)

1. M. Von Ardenne, Z. Phys. 1938, 109, 553.
2. M. Von Ardenne, Z. Techn. Phys. 1938,19, 407.
3. V. K. Zworykin, J. Hillier, R. L. Snyder, ASTM Bulletin 1942, 117, 15.
4. C. W. Oatley, J. Appl. Phys. 1982, 53, RI.
5. T. Nagatani, S. Saito, M. Sato. M. Yamada, Scanning Microscopy 1987, 1, 901.
6. T. E. Mulvey, C. D. Newman, Institute of Physics Conference Series 1973, 18, p. 16.
7. T. E. Everhart, R. F. M. Thornley, J. Set. Instrum. 1960, 37, 246.
8. K. C. A. Smith, Proceedings of the 5th Annual SEM Symposium (Ed: O. Johari), IITRI, Chicago 1972, p. 1.
9. J. I. Goldstein, D. E. Newbury, P. Echlin, D. C. Joy, A. D. Romig, C. E. Lyman, C. E. Fiori, E. Lifshin, Scanning Electron Microscopy and Xray Microanalysis, Plenum Press, New York 1992, Chapter 2.
10. H. Kinrura, H. Tamura, Proceedings of the 9th Annual Symposium on Electron, Ion, and Laser Beams 1967, p. 198.
11. D. C. Joy, Ultramicroscopy 1991, 37, 216.
12. D. C. Joy, Proceedings of the 52nd Annual Meeting MSA (Ed: G. W. Bailey, A. J. Garratt- Reed), San Francisco Press, San Francisco, 1994, p. 1032.
13. D. B. Holt, D. C. Joy, SEM Microcharacterization of Semiconductors, Academic Press, London 1989, Chapters 7 and 9.
14. K. Koike, K. Hayakawa, Japan. J. Appl. Phys. 1984, 23, L178.
15. E. de Harven, D. Soligo, Am. J. Anat. 1986,175, 277.
16. M. D. Ball, M. Wilson, S. Whitmarsh, in Electron Microscopy and Microanalysis 1987 (Ed: L. M. Brown), Institute of Physics, London 1987, p. 185.
17. P. C. Sercel, J. A. Lebens, K. J. Vahala, Rev. Sci. Instrum. 1989, 60, 3775.
18. J. Tixier, R. Philibert, Micron 1969, 1, 174.
19. D. C. Joy, D. E. Newbury, D. E. Davidson, J. Appl. Phys. 1982, 53, R81.
20. D. C. Joy, in High Resolution Electron Microscopy of Electron Defects (Ed: R. Sinclair, D. J. Smith, U. Dahmen), Materials Research Society, Warrington, PA, 1990, p. 199
21. J. T. Czerneska, N. J. Long, E. D. Boyes, P. B. Hirsch, Phil. Mag. Lett. 1990, 62, 111.
22. T. E. Everhart, O. C. Wells, C. W. Oatley, J. Electron. Control 1959, 7, 97.
23. H. J. Leamy, J. Appl. Phys. 1982, 53, R51.
24. B. G. Yacobi, D. B. Holt, Cathodoluminescence Microscopy of Inorganic Solids, Plenum Press, New York 1990, Chapter 1.
25. N. Yamamoto, J. C. H. Spence, D. Fathy, Phil. Mag. 1984, 49, 609.