-
1
-
-
85019379944
-
-
G. F. Hays, http://events.nace.org/euro/corrodia/Fall-2010/wco.asp.
-
-
-
Hays, G.F.1
-
2
-
-
84859042343
-
-
Springer-Verlag, Berlin, Heidelberg, Dordrecht, London New York
-
H. Raza, (ed.), Graphene Nanoelectronics: Metrology, Synthesis, Properties and Applications. Springer-Verlag, Berlin, Heidelberg, Dordrecht, London New York (2012), p. 598.
-
(2012)
Graphene Nanoelectronics: Metrology, Synthesis, Properties and Applications
, pp. 598
-
-
Raza, H.1
-
3
-
-
84857718091
-
-
D. Prasai, J. C. Tuberquia, R. R. Harl, G. K. Jennings, and K. I. Bolotin, ACS Nano 6, 1102 (2012).
-
(2012)
ACS Nano
, vol.6
, pp. 1102
-
-
Prasai, D.1
Tuberquia, J.C.2
Harl, R.R.3
Jennings, G.K.4
Bolotin, K.I.5
-
4
-
-
79951933527
-
-
S. Chen, L. Brown, M. Levendorf, W. Cai, S. Y. Ju, J. Edgeworth, X. Li, C. W. Magnuson, A. Velamakanni, R. D. Piner, J. Kang, J. Park, and R. S. Ruoff, ACS Nano 5, 1321 (2011).
-
(2011)
ACS Nano
, vol.5
, pp. 1321
-
-
Chen, S.1
Brown, L.2
Levendorf, M.3
Cai, W.4
Ju, S.Y.5
Edgeworth, J.6
Li, X.7
Magnuson, C.W.8
Velamakanni, A.9
Piner, R.D.10
Kang, J.11
Park, J.12
Ruoff, R.S.13
-
5
-
-
84866694051
-
-
D. Kang, J. Y. Kwon, H. Cho, J. H. Sim, H. S. Hwang, C. S. Kim, Y. J. Kim, R. S. Ruoff, and H. S. Shin, ACS Nano 6, 7763 (2012).
-
(2012)
ACS Nano
, vol.6
, pp. 7763
-
-
Kang, D.1
Kwon, J.Y.2
Cho, H.3
Sim, J.H.4
Hwang, H.S.5
Kim, C.S.6
Kim, Y.J.7
Ruoff, R.S.8
Shin, H.S.9
-
6
-
-
84877280852
-
-
S. C. Sahu, A. K. Samantara, M. Seth, S. Parwaiz, B. P. Singh, P. C. Rath, and B. K. Jena, Electrochem. Commun. 32, 22 (2013).
-
(2013)
Electrochem. Commun.
, vol.32
, pp. 22
-
-
Sahu, S.C.1
Samantara, A.K.2
Seth, M.3
Parwaiz, S.4
Singh, B.P.5
Rath, P.C.6
Jena, B.K.7
-
7
-
-
84869502858
-
-
S. J. R. Prabakar, Y.-H. Hwang, E. G. Bae, D. K. Lee, and M. Pyo, Carbon 52, 128 (2013).
-
(2013)
Carbon
, vol.52
, pp. 128
-
-
Prabakar, S.J.R.1
Hwang, Y.-H.2
Bae, E.G.3
Lee, D.K.4
Pyo, M.5
-
9
-
-
54549083300
-
-
J. I. Paredes, S. V. Rodil, A. M. Alonso, and J. M. D. Tascon, Langmuir 24, 10560 (2008).
-
(2008)
Langmuir
, vol.24
, pp. 10560
-
-
Paredes, J.I.1
Rodil, S.V.2
Alonso, A.M.3
Tascon, J.M.D.4
-
10
-
-
84877075104
-
-
I. Kruusenberg, J. Mondal, L. Matisen, V. Sammelselg, and K. Tammeveski, Electrochem. Commun. 33, 18 (2013).
-
(2013)
Electrochem. Commun.
, vol.33
, pp. 18
-
-
Kruusenberg, I.1
Mondal, J.2
Matisen, L.3
Sammelselg, V.4
Tammeveski, K.5
-
11
-
-
85019389448
-
-
J. Mondal, M. Merisalu, J. Kozlova, M. Marandi, A. Niilisk, T. Radusep, V. Sammelselg, CorrDefence 3628 (2013).
-
(2013)
CorrDefence
, vol.3628
-
-
Mondal, J.1
Merisalu, M.2
Kozlova, J.3
Marandi, M.4
Niilisk, A.5
Radusep, T.6
Sammelselg, V.7
-
12
-
-
79956109062
-
-
Z. J. Fan, W. Kai, J. Yan, T. Wei, L. J. Zhi, J. Feng, Y. M. Ren, L. P. Song, and F. Wei, ACS Nano 5, 191 (2011).
-
(2011)
ACS Nano
, vol.5
, pp. 191
-
-
Fan, Z.J.1
Kai, W.2
Yan, J.3
Wei, T.4
Zhi, L.J.5
Feng, J.6
Ren, Y.M.7
Song, L.P.8
Wei, F.9
-
13
-
-
84862682544
-
-
V. H. Pham, H. D. Pham, T. T. Dang, S. H. Hur, E. J. Kim, B. S. Kong, S. Kim, and J. S. Chung, J. Mater. Chem. 22, 10530 (2012).
-
(2012)
J. Mater. Chem.
, vol.22
, pp. 10530
-
-
Pham, V.H.1
Pham, H.D.2
Dang, T.T.3
Hur, S.H.4
Kim, E.J.5
Kong, B.S.6
Kim, S.7
Chung, J.S.8
-
14
-
-
77954842871
-
-
W. C. Oh, M. L. Chen, K. Zhang, and F. J. Zhang, J. Kor. Phys. Soc. 56, 1097 (2010).
-
(2010)
J. Kor. Phys. Soc.
, vol.56
, pp. 1097
-
-
Oh, W.C.1
Chen, M.L.2
Zhang, K.3
Zhang, F.J.4
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