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Volumn , Issue , 2014, Pages 1-372
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Atomic Force Microscopy (AFM): Principles, modes of operation and limitations
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BIOLOGY;
INDUSTRIAL RESEARCH;
MACROMOLECULES;
MECHANICAL PROPERTIES;
MICROSCOPES;
MORPHOLOGY;
NANOTECHNOLOGY;
PROBLEM SOLVING;
FORCE-DISTANCE CURVES;
INORGANIC MATERIALS;
INSTRUMENTAL ANALYSIS;
MICROSCOPIC ANALYSIS;
NANO SCIENCE AND TECHNOLOGIES;
SCIENTIFIC RESEARCHES;
STRUCTURE AND PROPERTIES;
UPDATED INFORMATIONS;
OPTICAL PROPERTIES;
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EID: 84958656223
PISSN: None
EISSN: None
Source Type: Book
DOI: None Document Type: Book |
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Times cited : (23)
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References (0)
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