Extended model-based testing toward high code coverage rate

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 2349, Issue , 2002, Pages 310-320

  Takahashi, Juichi ^a   Kakuda, Yoshiaki ^b  

^a SAP Labs Tokyo   (Japan)

^b HIROSHIMA CITY UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE SELECTION AND EVALUATION; GRAPHICAL USER INTERFACES; MODEL CHECKING;

APPLICATION BEHAVIORS; DEVELOPED MODEL; EFFECTIVE TESTING; EXTENDED MODEL; EXTERNAL FACTORS; GUI APPLICATIONS; MICROSOFT WINDOWS; MODEL BASED TESTING;

ABILITY TESTING;

EID: 84958645385     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-47984-8_34     Document Type: Conference Paper

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