The prediction of BRDFs from surface profile measurements

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1165, Issue , 1990, Pages 136-150

  Church, D L ^a   Takacs, P Z ^b   Leonard, T A ^c  

^a US Army ARDEC   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c Ball Aerospace Systems Division   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL ENGINEERING;

MECHANICAL MEASUREMENTS; OPTICAL PROFILES; PROFILE DATA; PROFILE MEASUREMENT; SCATTERING MODEL; SMOOTH SURFACE; SURFACE FINISHES; SURFACE PROFILE MEASUREMENTS;

SURFACE DEFECTS;

EID: 84958493729     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.962842     Document Type: Conference Paper

References (9)

1. E. L. Church, H. A. Jenkinson and J. M. Zavada “Relationship between surface scattering and microtopographic features” Optical Engineering 18 125-136 (1979).
2. E. L. Church/T. V. Vorburger and J. C. Wyant “Direct comparison of mechanical land optical measurements of the finish of precision machined optical surfaces” Optical Engineering 24 388-395 (1985).
3. E. L. Church “Fractal surface finish” Applied Optics 27 1518-1526 (1988).
4. T. A. Leonard and M. A. Pantoliano “BRDF round robin” Proc. SPIE 967 226-235 (1988).
5. E. L. Church and P. Z. Takacs “Instrumental effects in surface finish measurements” Proc. SPIE 1009 46-55 (1988).
6. E. L. Church and P. Z. Takacs “Subsurface and volume scattering from smooth surfaces” Paper 1165-04, this Conference.
7. T. A. Leonard, M. A. Pantoliano and J. Reilly “Results of a 002 round robin” Paper 1165-12/this Conference.
8. D. L. Church and P. Z. Takacs “Effects of the instrumental transfer fuinction on surface profile measurements” Paper 1164-09/this Symposium.
9. P. Z. Takacs, K. Furenlid, R. A. DeBiasse and E. L. Church “Surface topography measurements over the 1 meter to 10 micrometer spatial period bandwidth” Paper 1164-26/this Symposium.