Degradation of Methylammonium Lead Iodide Perovskite Structures through Light and Electron Beam Driven Ion Migration

Journal of Physical Chemistry Letters

Volumn 7, Issue 3, 2016, Pages 561-566

  Yuan, Haifeng ^a   Debroye, Elke ^a   Janssen, Kris ^a   Naiki, Hiroyuki ^a   Steuwe, Christian ^a   Lu, Gang ^a   Moris, Michèle ^a   Orgiu, Emanuele ^c   Uji I, Hiroshi ^a,b   De Schryver, Frans ^a   Samorì, Paolo ^c   Hofkens, Johan ^a,d   Roeffaers, Maarten ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b HOKKAIDO UNIVERSITY   (Japan)

^c UNIVERSITÉ DE STRASBOURG   (France)

^d UNIVERSITY OF COPENHAGEN   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; ELECTRON BEAMS; ELECTRON MICROSCOPY; ELECTRONS; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONS; LIGHT; MORPHOLOGY; OPTICAL PROPERTIES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ACCELERATION VOLTAGES; DEGRADATION PATHWAYS; LIGHT-INDUCED DEGRADATION; MATERIAL DECOMPOSITION; MATERIAL INSTABILITY; MORPHOLOGY EVOLUTION; PEROVSKITE STRUCTURES; SCANNING ELECTRON BEAM;

PEROVSKITE;

CALCIUM DERIVATIVE; IODIDE; LEAD; METHYLAMINE; OXIDE; PEROVSKITE; TITANIUM;

ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRON; SCANNING ELECTRON MICROSCOPY;

CALCIUM COMPOUNDS; ELECTRONS; IODIDES; LEAD; METHYLAMINES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; OXIDES; TITANIUM;

EID: 84957553089     PISSN: None     EISSN: 19487185     Source Type: Journal    
DOI: 10.1021/acs.jpclett.5b02828     Document Type: Article

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