Use of reflective baffles for control of aperture heat loads and stray radiation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 330, Issue , 1982, Pages 60-67

  Rock, D F ^a   Warren, A D ^a   Lewanski, A J ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION; STRAY LIGHT; SYSTEMS ENGINEERING;

BACKGROUND RADIATION; ELLIPTICAL CROSS SECTION; FABRICATION TOLERANCES; INFRARED WAVELENGTHS; RADIATION SOURCE; SENSOR APPLICATIONS; STRAY RADIATION; TRADITIONAL APPROACHES;

OPTICAL SYSTEMS;

EID: 84957468376     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.934257     Document Type: Conference Paper

References (4)

1. R. P. Breault, A. W. Greynolds, S. R. Lange, “APART/FADE Version 7: A Deterministic Computer Program Used to Calculate Scattered and Diffracted Energy, ” Proc. SPIE, Vol. 257. 4647
2. J. Van Workum f J.A. Plascyk, and M.L. Skolnick, “Laser Wavefront Analyzer for Diagnosing High-Energy Lasers", in SPIE Proceedings, Vol. 141, p. 58 (1978).
3. M. Born and E. Wolf, Principles of Optics, 4th edition, Pergamon Press, 1970, p.51-70.
4. J.M. Elson, “Infrared Light Scattering from Surfaces covered with Multiple Dielectric Overlayers”, Appl. Opt., 16 (11), pp.2872-2881 (1977).