Influence of Rapid Thermal Annealing on Structural and Interfacial Properties of Lead-Zirconate-Titanate Thin Films Prepared by Excimer Laser Deposition

Chinese Physics Letters

Volumn 11, Issue 8, 1994, Pages 518-521

  Zheng, Lirong ^a   Chen, Yiqing ^a   Lin, Chenglu ^a   Zou, Shichang ^a  

^a SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84957335896     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/11/8/015     Document Type: Article

References (6)

1. Swartz S L and Wood V E 1992 Condensed Matter News 1 4
2. Kidoh H, Ogawa T, Yashima H, Morimoto A and Shimizu T 1991 Japan. J. Appl. Phys. B 30 2167
3. Roy R A, Etzold K F and Cuomo J J Ferroelectric Thin Films MRS Sympo. Proc. 200, Pittsburgh, PA ed E R Myers and A I Kingon p 141
4. Cotell C M and Grabowski K S Feburary 1992 Laser Ablation (MRS BULLETIN) p 44
5. Roy D and Krupanidhi S B 1992 J. Mater. Res. 7 2521
6. Tuttle B A, Schwartz R W, Doughty D H and Voigt J A Ferroelectric thin films MRS Sympo. Proc. 200, Pittsburg, PA, 1990 ed E R Myers and A I Kingon p 159