The small-angle neutron scattering instrument D33 at the Institut Laue-Langevin

Journal of Applied Crystallography

Volumn 49, Issue , 2016, Pages 1-14

  Dewhurst, C D ^a   Grillo, I ^a   Honecker, D ^a   Bonnaud, M ^a   Jacques, M ^a   Amrouni, C ^a   Perillo Marcone, A ^a,b   Manzin, G ^a   Cubitt, R ^a  

^a INSTITUT LAUE LANGEVIN   (France)

^b CERN   (Switzerland)

Author keywords

3He analysis; D33; polarization; small angle neutron scattering (SANS); time of flight (TOF)

Indexed keywords

CHARACTERIZATION; MAGNETISM; POLARIZATION;

3HE ANALYSIS; HIGH MAGNETIC FIELDS; INDIVIDUAL COMPONENTS; SCATTERING VECTORS; SCIENTIFIC DISCIPLINE; SOLUTION SCATTERINGS; TIME OF FLIGHT; WAVELENGTH RESOLUTION;

NEUTRON SCATTERING;

EID: 84957104746     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S1600576715021792     Document Type: Article

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