Process control via gaze detection technology

Proceedings of the 2nd International Conference on Intelligent Processing and Manufacturing of Materials, IPMM 1999

Volumn 2, Issue , 1999, Pages 1263-1269

  Kim, Jaihie ^a   Park, Gang Ryung ^b   LeClair, Steven ^a  

^a Yonsei University   (South Korea)

^b AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84957035424     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPMM.1999.791556     Document Type: Conference Paper

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