Using negative correlation to evolve fault-tolerant circuits

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 2606, Issue , 2003, Pages 35-46

  Schnier, Thorsten ^a   Yao, Xin ^a  

^a UNIVERSITY OF BIRMINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BIOLOGY; RANDOM ACCESS STORAGE; TIMING CIRCUITS;

ARTIFICIAL EVOLUTION; FAULT MODEL; FAULT PATTERNS; FAULT-TOLERANT; FITNESS SHARING; NEGATIVE CORRELATION;

FAULT TOLERANCE;

EID: 84956973317     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/3-540-36553-2_4     Document Type: Conference Paper

References (11)

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