Interface effects on drain current instability in GaAs MESFETs with buffer layer

Japanese Journal of Applied Physics

Volumn 19, Issue , 1980, Pages 351-355

  Itoh, Tomohiro ^a   Yanai, Hisayoshi ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84956267968     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.7567/JJAPS.19S1.351     Document Type: Article

References (12)

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