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Volumn 6, Issue 3, 1988, Pages 1602-1608

Transmission electron microscopy studies of brown and golden titanium nitride thin films as diffusion barriers in very large scale integrated circuits

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EID: 84956039609     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.575335     Document Type: Article
Times cited : (73)

References (36)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.