X-Ray Diffraction Topography

Handbook of Microscopy: Applications in Materials Science , Solid-state Physics and Chemistry

Volumn 1, Issue , 2008, Pages 177-192

  Schlenker, Michel ^a   Baruchel, Joś ^a  

^a CNRS   (France)

Author keywords

Domain boundaries; Magnitude; Photographic plate; Stacking faults; Topography

Indexed keywords

CONDENSED MATTER PHYSICS; MATERIALS SCIENCE; PHOTOGRAPHIC FILMS; STACKING FAULTS; TOPOGRAPHY;

DOMAIN BOUNDARY; MAGNITUDE; X-RAY DIFFRACTION TOPOGRAPHY;

X RAY DIFFRACTION;

EID: 84955716772     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527620647.ch11     Document Type: Chapter

References (15)

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