Depth profiling with step-scan FT-IR photoacoustic spectroscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2089, Issue , 1994, Pages 302-303

  McClelland, J F ^a   Jones, R W ^a   Ochiai, S ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH PROFILING; FREQUENCY MODULATION; SPECTROMETERS;

DEPTH DEPENDENTS; FT-IR-SPECTROMETERS; MODULATION FREQUENCIES; PHASE DIFFERENCE;

PHOTOACOUSTIC SPECTROSCOPY;

EID: 84954662978     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.166579     Document Type: Conference Paper

References (1)

1. J. F. McClelland, "Photoacoustic Spectroscopy", Analytical Chemistry 55, 89A (1983).