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Volumn , Issue , 2014, Pages 57-65
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High-throughput quantitative assay for analyzing neurite outgrowth on a uniform substratum: The cell-substratum assay
a a a |
Author keywords
High throughput; Image quantification; Neurite outgrowth; Software
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Indexed keywords
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EID: 84954581471
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1007/978-1-4939-2083-9_6 Document Type: Chapter |
Times cited : (2)
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References (3)
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