Automated TTCN-3 test case generation by means of UML sequence diagrams and Markov chains

Proceedings of the Asian Test Symposium

Volumn 2003-January, Issue , 2003, Pages 102-105

  Beyer, M ^a   Dulz, W ^a   Zhen, Fenhua ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHAINS; HYPERTEXT SYSTEMS; MARKUP LANGUAGES; TESTING;

COMMON INTERFACES; MARKOV CHAIN MARKUP LANGUAGES; SEQUENCE DIAGRAMS; SPECIFICATION BASED TESTING; STATISTICAL USAGE TESTING; TEST CASE GENERATION; TESTING AND TEST CONTROL NOTATION VERSION 3; UML SEQUENCE DIAGRAMS;

MARKOV PROCESSES;

EID: 84954412875     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ATS.2003.1250791     Document Type: Conference Paper

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