Comparison of calibrated S-parameters measured under CW and Pulsed RF excitation with a NonLinear Vectorial Network Analyzer

55th ARFTG Conference Digest: Going Beyond S-Parameters, ARFTG 2000

Volumn , Issue , 2000, Pages

  Vael, Philip ^a   Rolain, Yves ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

PULSE AMPLIFIERS; SCATTERING PARAMETERS;

CARRIER MODULATION; CONTINUOUS WAVE; MEASUREMENT QUALITY; MEASUREMENTS OF; PHASE COHERENT; PULSED MEASUREMENTS; SIMULTANEOUS MEASUREMENT; VECTORIAL NETWORK ANALYZERS;

ELECTRIC NETWORK ANALYZERS;

EID: 84954163323     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.2000.327414     Document Type: Conference Paper

References (6)

1. J. Verspecht, P. Debie, A. Barel, L. Martens, 'Accurate On-Wafer Measurement of Phase and Amplitude of the Spectral Components of Incident and Scattered Voltage Waves at the Signal Ports of a Nonlinear Microwave Device', IEEE-MTT-S, Orlando, U.S.A., May 1995, pp. 1029-1032.
2. T. Van den Broeck, J. Verspecht, 'Calibrated Vectorial Nonlinear-Network Analyzers', IEEE-MTT-S, San Diego, U.S.A., 1994, pp 1069-1072.
3. Philip Vael and Yves Rolain, 'A controllable phase coherent modulated rf signal for the use with microwave network analyzer measurements', IEEE Transactions on Microwave Theory and Techniques, Vol. 47, No.12, December 1999, pp. 2605-2612.
4. Frederic J. Harris, 'On the Use of Windows for Harmonic Analysis with the Discrete Fourier Transform', Proceedings of the IEEE, Vol. 66., No. 1., January 1978, pp. 51-83.
5. Hewlett-Packard, 'The Microwave Transition Analyzer: Measure 25ps Transitions in Switched and Pulsed Microwave Components', Product Note 70820/2.
6. J.S. Bendat, 'The Hilbert Transform and Applications to Correlation Measurements', Bruel and Kjaer.