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Electron Microscopy: Principles and Fundamentals

Volumn , Issue , 2007, Pages 427-456

Scanning Microanalysis

(2) Gijbels, Renaat a Oleshko, Vladimir a,b

a UNIVERSITY OF ANTWERP (Belgium)

b SEMENOV INSTITUTE OF CHEMICAL PHYSICS (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84954107616 PISSN: None EISSN: None Source Type: Book
DOI: 10.1002/9783527614561.ch2 Document Type: Chapter

Times cited : (1)

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