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Volumn 6, Issue 2, 1988, Pages 519-523

Scanning tunneling microscopy characterization of the geometric and electronic structure of hydrogen-terminated silicon surfaces

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Indexed keywords


EID: 84953681922     PISSN: 07342101     EISSN: 15208559     Source Type: Journal    
DOI: 10.1116/1.575372     Document Type: Article
Times cited : (78)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.