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Volumn 6, Issue 2, 1988, Pages 519-523
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Scanning tunneling microscopy characterization of the geometric and electronic structure of hydrogen-terminated silicon surfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84953681922
PISSN: 07342101
EISSN: 15208559
Source Type: Journal
DOI: 10.1116/1.575372 Document Type: Article |
Times cited : (78)
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References (21)
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