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Volumn 3, Issue 3, 1994, Pages 231-238
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Characterization of NiO by XPS
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Author keywords
[No Author keywords available]
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Indexed keywords
BINDING ENERGY;
NICKEL OXIDE;
PHOTOEMISSION;
SPECTROMETERS;
ELECTRONIC MODEL;
ENERGY;
ENERGY RANGES;
ENERGY RESOLUTIONS;
NICKELOUS OXIDE;
PHOTOEMISSION LINES;
PHYSICAL ELECTRONICS;
SPECTRA'S;
X RAY PHOTOELECTRON SPECTROMETERS;
X-RAY PHOTOEMISSION SPECTRA;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 84953649412
PISSN: 10555269
EISSN: 15208575
Source Type: Journal
DOI: 10.1116/1.1247751 Document Type: Article |
Times cited : (396)
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References (4)
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