Structural, Optical and Electrical Characteristics of a La0.5K0.5Ga0.5V0.5O3 System

Journal of Electronic Materials

Volumn 45, Issue 2, 2016, Pages 947-958

  Acharya, Truptimayee ^a   Choudhary, R N P ^a  

^a SIKSHA O ANUSANDHAN DEEMED TO BE UNIVERSITY   (India)

Author keywords

conductivity; dielectric properties; ferroelectricity; infrared spectroscopy; X ray diffraction

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC CONDUCTIVITY; ENERGY GAP; FERROELECTRICITY; GALLIUM; GRAIN BOUNDARIES; HIGH TEMPERATURE APPLICATIONS; INFRARED SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SOLID STATE REACTIONS; SPECTRUM ANALYSIS; UNSATURATED COMPOUNDS; X RAY DIFFRACTION;

ELECTRICAL CHARACTERISTIC; HIGH TEMPERATURE SOLID-STATE REACTION; NEGATIVE TEMPERATURES; OPTICAL INDIRECT BAND GAPS; ORTHORHOMBIC CRYSTAL SYSTEM; POLYCRYSTALLINE SAMPLES; SINGLE-PHASE COMPOUND; X RAY STRUCTURAL ANALYSIS;

STRUCTURAL ANALYSIS;

EID: 84953365979     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-015-4235-1     Document Type: Article

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