Use of quartz crystal microbalance sensors for monitoring fouling and viscoelastic phenomena in industrial process applications

SIcon 2001 - Proceedings of the 1st ISA/IEEE Sensors for Industry Conference

Volumn , Issue , 2001, Pages 241-245

  Kraus, P R ^a   Cooper, F L ^a   Emmons, D H ^a   Ferguson, S ^a   McClain, R D ^a   Spates, J J ^b  

^a NALCO COMPANY   (United States)

^b KTECH CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

QUARTZ;

DEVELOPMENT AND APPLICATIONS; ELEVATED TEMPERATURE; INDUSTRIAL PROCESS APPLICATIONS; INDUSTRIAL PROCESSS; INTERFACIAL PHENOMENA; QUARTZ CRYSTAL MICROBALANCE SENSORS; SENSITIVE TECHNIQUES;

QUARTZ CRYSTAL MICROBALANCES;

EID: 84953250531     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SFICON.2001.968537     Document Type: Conference Paper

References (4)

1. Sauerbrey, G.; Z. Phys., 1959, 155, 206
2. Kanazawa, K.K.; Gordon, J.G.; Anal. Chim. Acta, 1985, 175, 99
3. K.O. Wessendorf, US patent 5416448, May 16, 1995
4. Martin, S.J.; Frye, G.C.; Wessendorf, K.O.; Sensors and Actuators A, 1994, 44, 209