메뉴 건너뛰기




Volumn 2002-January, Issue , 2002, Pages 159-166

Discrete availability models to rejuvenate a telecommunication billing application

Author keywords

Aging; Application software; Availability; Cleaning; Engineering management; Humans; Informatics; Software performance; Software safety; Software testing

Indexed keywords

AGING OF MATERIALS; AVAILABILITY; CLEANING; COMPUTER SOFTWARE SELECTION AND EVALUATION; ENDOCRINOLOGY; MARKOV PROCESSES; SAFETY TESTING; SOFTWARE TESTING; STATISTICAL TESTS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; SYSTEMS ENGINEERING;

EID: 84952781241     PISSN: 15302059     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HASE.2002.1173117     Document Type: Conference Paper
Times cited : (2)

References (18)
  • 1
    • 0021199968 scopus 로고
    • Optimizing preventive service of the software products
    • Adams, E. (1984), Optimizing preventive service of the software products, IBM J. Research & Development, 28, 2-14.
    • (1984) IBM J. Research & Development , vol.28 , pp. 2-14
    • Adams, E.1
  • 4
    • 0030646329 scopus 로고    scopus 로고
    • Monitoring smoothly degrading systems for increased dependability
    • Avritzer, A. and Weyuker, E.J. (1997), Monitoring smoothly degrading systems for increased dependability, Empirical Software Engineering, 2, 59-77.
    • (1997) Empirical Software Engineering , vol.2 , pp. 59-77
    • Avritzer, A.1    Weyuker, E.J.2
  • 5
    • 34247278391 scopus 로고
    • Fatal error: How Patriot overlooked a scud
    • Marshall, E. (1992), Fatal error: how Patriot overlooked a scud, Science, 3, 1347.
    • (1992) Science , vol.3 , pp. 1347
    • Marshall, E.1
  • 6
    • 0032046684 scopus 로고    scopus 로고
    • Toward integrated methods for high assurance systems
    • Yen, I.-L., Paul, R. and Mori, K. (1998), Toward integrated methods for high assurance systems, IEEE Computer, 31, 32-34.
    • (1998) IEEE Computer , vol.31 , pp. 32-34
    • Yen, I.-L.1    Paul, R.2    Mori, K.3
  • 7
    • 0003018691 scopus 로고
    • High-availability computer systems
    • Gray, J. and Siewiorek, D. P. (1991), High-availability computer systems, IEEE Computer, 9, 39-48.
    • (1991) IEEE Computer , vol.9 , pp. 39-48
    • Gray, J.1    Siewiorek, D.P.2
  • 8
    • 0003336551 scopus 로고
    • Making SDI software reliable through fault-tolerant techniques
    • Grey, B. O. A. (1987), Making SDI software reliable through fault-tolerant techniques, Defense Electronics, 8, 77-80.
    • (1987) Defense Electronics , vol.8 , pp. 77-80
    • Grey, B.O.A.1
  • 12
    • 84949519090 scopus 로고    scopus 로고
    • Statistical non-parametric algorithms to estimate the optimal software rejuvenation schedule
    • IEEE Computer Society Press, Los Alamitos, CA
    • Dohi, T., Gǒseva-Popstojanova, K. and Trivedi, K. S. (2000), Statistical non-parametric algorithms to estimate the optimal software rejuvenation schedule, Proc. 2000 Pacific Rim Int'l Symp. on Dependable Computing, 77-84, IEEE Computer Society Press, Los Alamitos, CA.
    • (2000) Proc. 2000 Pacific Rim Int'l Symp. on Dependable Computing , pp. 77-84
    • Dohi, T.1    Gǒseva-Popstojanova, K.2    Trivedi, K.S.3
  • 13
    • 0035668281 scopus 로고    scopus 로고
    • Estimating software rejuvenation schedule in high assurance systems
    • Dohi, T., Goševa-Popstojanova, K. and Trivedi, K. S. (2001), Estimating software rejuvenation schedule in high assurance systems, The Computer Journal, 44, 473-485.
    • (2001) The Computer Journal , vol.44 , pp. 473-485
    • Dohi, T.1    Goševa-Popstojanova, K.2    Trivedi, K.S.3
  • 17
    • 0002005187 scopus 로고
    • Total time on test processes and applications to failure data analysis
    • (R. E. Barlow, J. Fussell and N. D. Singpurwalla, eds.), SIAM, Philadelphia, PA
    • Barlow, R. E. and Campo, R. (1975), Total time on test processes and applications to failure data analysis, Reliability and Fault Tree Analysis (R. E. Barlow, J. Fussell and N. D. Singpurwalla, eds.), 451-481, SIAM, Philadelphia, PA.
    • (1975) Reliability and Fault Tree Analysis , pp. 451-481
    • Barlow, R.E.1    Campo, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.