Optical determination of δ-doping concentration in semiconductor structures

ASDAM 2000 - Conference Proceedings: 3rd International EuroConference on Advanced Semiconductor Devices and Microsystems

Volumn , Issue , 2000, Pages 183-186

  Babiński, Adam ^a   Kulawinski R ^a   Tomaszewicz, T ^a   Baranowski, J M ^a  

^a UNIVERSITY OF WARSAW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRIC FIELDS; MICROSYSTEMS; SEMICONDUCTOR DOPING; SEMICONDUCTOR QUANTUM WELLS;

DELTA LAYERS; DELTA-DOPING; ELECTROREFLECTANCE; FRANZ-KELDYSH OSCILLATIONS; IONIZED DOPANTS; OPTICAL DETERMINATION; SEMICONDUCTOR STRUCTURE; WAVELENGTH MAPPING;

SEMICONDUCTOR DEVICES;

EID: 84952008015     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASDAM.2000.889476     Document Type: Conference Paper

References (10)

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10. A. Babinski, R. Kulawinski, T. Tomaszewicz, J. M. Baranowski, will be published