Tests of 6-MV triggered switches on APPRM at SNL

PPPS 2001 - Pulsed Power Plasma Science 2001

Volumn 2, Issue , 2001, Pages 1778-1781

  Corley, J P ^a   Dixon, M A ^a   Kim, A A ^b   Kovalchuk, B M ^b   Sinebryukhov, V A ^b   Volkov, S N ^b   Hodge, K C ^c   Drennan, S A ^c   Navarro, J M ^c   Johnson, D L ^d   Avrillaud, G ^e   Lassalle, F ^f  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b INSTITUTE OF HIGH CURRENT ELECTRONICS   (Russian Federation)

^c KTECH CORPORATION   (United States)

^d Maxwell Technologies Inc   (United States)

^e International Technologies for High Pulsed Power   (France)

^f Centre d'Etude de Gramat   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRODES; EQUIPMENT TESTING;

COMPOSITE ELECTRODE; DISCHARGE CURRENTS; FUTURE GENERATIONS; PARALLEL CHANNEL; SANDIA NATIONAL LABORATORIES; SINGLE CHANNELS; SPARK CHANNELS; TRIGGERED SWITCHES;

PULSED POWER TECHNOLOGY;

EID: 84951993441     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PPPS.2001.1001917     Document Type: Conference Paper

References (1)

1. th IEEE Pulsed Power Conference (1985), pp 579-582.