Automatic seal verification by evaluating positive cost

Proceedings of the International Conference on Document Analysis and Recognition, ICDAR

Volumn 2001-January, Issue , 2001, Pages 572-576

  Horiuchi, Takahiko ^a  

^a IWATE PREFECTURAL UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN MATCHING;

AUTOMATIC VERIFICATION; CORRELATION VALUE; GENERAL PATTERNS; INPUT PATTERNS; NEW APPROACHES; PERSON IDENTIFICATION; REFERENCE IMAGE; REFERENCE PATTERNS;

COSTS;

EID: 84951773214     PISSN: 15205363     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDAR.2001.953854     Document Type: Conference Paper

References (10)

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