Point Defects and Diffusion in Semiconductors

MRS Bulletin

Volumn 16, Issue 11, 1991, Pages 42-46

  GöSele, Ulrich M ^a   Tan, Teh Y ^a  

^a NONE

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EID: 84950542463     PISSN: 08837694     EISSN: 19381425     Source Type: Journal    
DOI: 10.1557/S0883769400055512     Document Type: Article

References (23)

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