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Volumn 2001-January, Issue , 2001, Pages 117-122

Analysis and design of ESD protection circuits for high-frequency/RF applications

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COPLANAR WAVEGUIDES; DESIGN; ELECTROSTATIC DISCHARGE; IMPEDANCE MATCHING (ELECTRIC); SCATTERING PARAMETERS;

EID: 84949998095     PISSN: 19483287     EISSN: 19483295     Source Type: Conference Proceeding    
DOI: 10.1109/ISQED.2001.915215     Document Type: Conference Paper
Times cited : (15)

References (8)
  • 2
    • 0000345766 scopus 로고    scopus 로고
    • The state of the art of electrostatic discharge protection: Physics, technology, circuits, design, simulation, and scaling
    • S. H. Voldman, "The State of the Art of Electrostatic Discharge Protection: Physics, Technology, Circuits, Design, Simulation, and Scaling," IEEE J. of Solid-State Circuits, Vol. 34, No. 9, pp. 1272-1282, 1999.
    • (1999) IEEE J. of Solid-State Circuits , vol.34 , Issue.9 , pp. 1272-1282
    • Voldman, S.H.1
  • 4
    • 0031337211 scopus 로고    scopus 로고
    • ESD issues in compound semiconductor high frequency devices and circuits
    • K. Bock, "ESD Issues in Compound Semiconductor High Frequency Devices and Circuits," Proc. EOS/ESD Symp. 1997, pp. 1-12.
    • (1997) Proc. EOS/ESD Symp. , pp. 1-12
    • Bock, K.1
  • 5
    • 84949982277 scopus 로고    scopus 로고
    • US Patent Oct.
    • B. Kleveland, and T. Lee, US Patent # 5,929,969, Oct. 1999.
    • (1999)
    • Kleveland, B.1    Lee, T.2
  • 6
    • 0034249970 scopus 로고    scopus 로고
    • Distributed ESD protection for high speed integrated circuits
    • B. Kleveland, et al, "Distributed ESD Protection for High Speed Integrated Circuits," IEEE Electron Device Lett., Vol. 21, No. 8, pp. 390-392, 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , Issue.8 , pp. 390-392
    • Kleveland, B.1
  • 7
    • 0034543814 scopus 로고    scopus 로고
    • Investigation on different ESD protection strategies devoted to 3.3V RF applications (2GHz) in a 0.18um CMOS process
    • C. Richier, et al, "Investigation on Different ESD Protection Strategies Devoted to 3.3V RF Applications (2GHz) in a 0.18um CMOS Process," Proc. EOS/ESD Symp., 2000, pp. 251-259.
    • (2000) Proc. EOS/ESD Symp. , pp. 251-259
    • Richier, C.1
  • 8
    • 0031639861 scopus 로고    scopus 로고
    • 50GHz interconnect design in standard silicon technology
    • B. Kleveland, et al, "50GHz Interconnect Design in Standard Silicon Technology," Proc. MTT-S, 1998, pp. 1913-1916.
    • (1998) Proc. MTT-S , pp. 1913-1916
    • Kleveland, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.