Degradation characterization of AlGaInP LEDs using I-V and low frequency noise measurements

Proceedings of the International Conference on Microelectronics, ICM

Volumn 2000-January, Issue , 1999, Pages 43-46

  Naby, M A ^a  

^a Tanta University   (Egypt)

Author keywords

Degradation; Frequency measurement; Knee; Leakage current; Light emitting diodes; Low frequency noise; Noise measurement; Stress measurement; Temperature measurement; Thermal stresses

Indexed keywords

ACOUSTIC NOISE MEASUREMENT; DEGRADATION; DIODES; ELECTRIC RESISTANCE; HETEROJUNCTION BIPOLAR TRANSISTORS; LEAKAGE CURRENTS; MICROELECTRONICS; SPURIOUS SIGNAL NOISE; STRESS MEASUREMENT; TEMPERATURE MEASUREMENT; THERMAL STRESS;

DEGRADATION CHARACTERIZATIONS; DEGRADATION MECHANISM; FREQUENCY MEASUREMENTS; KNEE; LOW-FREQUENCY NOISE; LOW-FREQUENCY NOISE MEASUREMENTS; NOISE MEASUREMENTS; ULTRA HIGH BRIGHTNESS;

LIGHT EMITTING DIODES;

EID: 84949815560     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICM.2000.884801     Document Type: Conference Paper

References (6)

1. Yi-Jen Chan and Dimitris Pavlidis, IEEE Trans Electron Devices, Vol.41, No.5. pp. 637-642, (1994).
2. Steven M. Baier, Michael S.Shur, K.Lee, Nicholas C. Cirillo jr., IEEE Trans.Electron Devices 32, 12, 2824,(1985).
3. S.Lampe, J.Deker, M.Heuken, Proceedings of the International Symposium on Blue Laser and light Emitting Diodes,453-456 Chipa, Japan (1996)
4. L.K.J. Vandamme, IEEE Transactions on ED, Vol..41, p.2176,(1994)
5. G.I.Ng and D. Pavlidis, IEEE Trans.Electron Devices, vol.38,.862, (1991).
6. Munecazu Tacano, Solid-State Electronics Vol.34, No.8, 917, (1991).