Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides

IEEE International Reliability Physics Symposium Proceedings

Volumn 2001-January, Issue , 2001, Pages 386-392

  Roussel, P ^a   Degraeve, R ^a   Van Den Bosch, C ^a   Kaczer, B ^a   Groeseneken, G ^a  

^a IMEC   (Belgium)

Author keywords

Automatic testing; Carbon capture and storage; Electric breakdown; Failure analysis; Geometry; Integrated circuit noise; Joining processes; Low voltage; Noise robustness; Thermal stresses

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; CARBON; CARBON CAPTURE; ELECTRIC BREAKDOWN; FAILURE ANALYSIS; GEOMETRY; INTEGRATED CIRCUITS; THERMAL STRESS;

CONSTANT VOLTAGE STRESS; FAILURE MECHANISM; GATE CURRENT NOISE; INTEGRATED CIRCUIT NOISE; JOINING PROCESS; LOW VOLTAGES; NOISE ROBUSTNESS; TRIGGER ALGORITHMS;

INTEGRATED CIRCUIT TESTING;

EID: 84949743616     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2001.922931     Document Type: Conference Paper

References (6)

1. M. Depas, T. Nigam et al. IEEE Trans. Elec. Dev., vol. 43, no. 9, pp. 1499-1504, 1996.
2. E.Y. Wu et al. IEDM Tech. Dig., pp. 187-190, 1998.
3. F. Crupi, R. Degraeve et al. IEEE Trans. Elec. Dev., vol. 45, no. 11, pp. 2329-2334, 1998.
4. B. Weir et al., IEDM Tech. Dig, pp. 73-76, 1997.
5. G.B. Alers et al., IRPS Proc., pp.76-79, 1998.
6. S. Baase, Computer Algorithms. New York: Addison-Wesley, 1988, ch. 2, pp. 47-52.