Simulation strategy after model checking: Experience in industrial SOC design

Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT

Volumn 2000-January, Issue , 2000, Pages 77-79

  Choi, Hoon ^a   Yun, Byeong Whee ^a   Lee, Yun Tae ^a  

^a SAMSUNG Electronics   (South Korea)

Author keywords

Assembly; Computer bugs; Control systems; Electronic mail; Electronics industry; Fabrication; Industrial electronics; Large scale integration; Reduced order systems; System testing

Indexed keywords

ASSEMBLY; COMPUTER CONTROL SYSTEMS; CONTROL SYSTEMS; ELECTRONIC MAIL; ELECTRONICS INDUSTRY; FABRICATION; INDUSTRIAL ELECTRONICS; INTEGRATION TESTING; LSI CIRCUITS; MICROPROCESSOR CHIPS; PROGRAM DEBUGGING;

COMPUTER BUGS; REDUCED ORDER SYSTEMS; SIMULATION STRATEGIES; SOC DESIGNS; SPEED-UP TECHNIQUES; SYSTEM TESTING;

MODEL CHECKING;

EID: 84949646883     PISSN: 15526674     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HLDVT.2000.889563     Document Type: Conference Paper

References (8)

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