R&D toward a 15+% efficiency solar cell manufacturing line for EFG silicon wafers

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn 2000-January, Issue , 2000, Pages 194-197

  Bathey, B R ^a   Kalejs, J P ^a   Rosenblum, M D ^a   Kardauskas, M J ^b   Giancola, R M ^a   Cao, J ^a  

^a ASE Americas Inc   (United States)

^b Materials for Electronics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN OF EXPERIMENTS; EFFICIENCY; MANUFACTURE; SILICON NITRIDE; SILICON SOLAR CELLS; SOLAR CELLS; STATISTICAL PROCESS CONTROL;

CELL FABRICATIONS; DESIGN OF EXPERIMENT TECHNIQUES (DOE); MANUFACTURING LINES; MULTICRYSTALLINE SILICON WAFERS; PURIFICATION METHOD; SHEET RESISTIVITY; SOLAR CELL MANUFACTURING; SOLAR CELL PROCESSING;

SILICON WAFERS;

EID: 84949569720     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2000.915787     Document Type: Conference Paper

References (4)

1. J. Bailey, J. P. Kalejs, and C. Keavney, "Material Electronic Quality Specification Factors For Polycrystalline Silicon Wafers", Proc. of 1st World Conference of Photovoltaic Energy Conversion, Waikoloa, HI, December 4-9, 1994, (IEEE, NY, 1994), pp. 1356-1359.
2. JMP® is a product of SAS Institute, Inc. (Cary, NC).
3. J. I. Hanoka and S. E. Danielson, "Method for Forming Contacts", U.S. Patent No. 5,151,377, Sep. 29, 1992.
4. J. A. Amick, F. J. Bottari, and J. I. Hanoka, "The Effect of Aluminum Thickness on Solar Cell Performance", J. Electrochem. Soc. 141, 1994, pp. 1577-85.