Experimental verification of the statistical model for migration enhanced upconversion in Er-doped silica

European Conference on Optical Communication, ECOC

Volumn 1, Issue , 2002, Pages

  Khoptyar, Dmitry ^a   Jaskorzynska, Bozena ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY KTH   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

SILICA;

CW EXCITATION; ER-DOPED; ER-DOPED GLASS; EXPERIMENTAL VERIFICATION; STATISTICAL MODELING; UP CONVERSION;

OPTICAL COMMUNICATION;

EID: 84949257068     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. J.L.Philipsen et al, IEEE J. Quant.Electron. 33(1997). 845
2. D. Bremberg et al, Electron. Lett. 14 (1999), 1189
3. D. Khoptyar et al, Technical Digest of CLEO/Europe (2001)
4. V. Sergeyev et al Phys. Rev. B, 62(2000), 15628.
5. Marcin Swillo et al, Integrated Photonic Research, OSA (1999), 73