Formation of electrical interconnects by self-trapping of DNA molecules

Digest of Papers - Microprocesses and Nanotechnology 2003 - 2003 International Microprocesses and Nanotechnology Conference, MNC 2003

Volumn , Issue , 2003, Pages 216-217

  Hwang, J S ^a   Hwang, S W ^a,b   Ahn, D ^a  

^a University of Seoul   (South Korea)

^b Korea University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRODES; GOLD; MOLECULES; NANOTECHNOLOGY;

ELECTRICAL INTERCONNECTIONS; ELECTRICAL INTERCONNECTS; GOLD ELECTRODES; IV CHARACTERISTICS; MOLECULAR MATERIALS; NANOMETER-SCALE ELECTRONIC DEVICES; SELF TRAPPING; SELF-TRAPPING PROCESS;

DNA;

EID: 84949212831     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMNC.2003.1268718     Document Type: Conference Paper

References (3)

1. D. Polath, A. Beayadin, S. Vries, and C. Dekker, Nature 403, 635 (2000).
2. A. J. Storm, J. van Noort, S. de Vries, and C. Dekker, Appl. Phys. Lett., 79, 3881 (2001).
3. J. S. Hwang, K. J. Kong, D. Ahn, G. S. Lee, D. J. Ahn, and S. W. Hwang, Appl. Phys. Lett., 81, 11 34 (2002).