Finite sample identifiability of multiple constant modulus sources

Proceedings of the IEEE Sensor Array and Multichannel Signal Processing Workshop

Volumn 2002-January, Issue , 2002, Pages 408-412

  Leshem, Amir ^a,b   Petrochilos, Nicolas ^a,c   Van Der Veen, Alle Jan ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Metalink Broadband Access   (Israel)

^c UNIVERSITY OF NICE SOPHIA ANTIPOLIS   (France)

Author keywords

Blind source separation; Chernoff bound; Constant modulus signals; Finite sample analysis; Identifiability; Large deviations; PSK

Indexed keywords

BLIND SOURCE SEPARATION; PHASE SHIFT KEYING; SAMPLING;

CHERNOFF BOUNDS; CONSTANT MODULUS SIGNALS; FINITE SAMPLES; IDENTIFIABILITY; LARGE DEVIATIONS;

SIGNAL PROCESSING;

EID: 84949196388     PISSN: None     EISSN: 2151870X     Source Type: Conference Proceeding    
DOI: 10.1109/SAM.2002.1191071     Document Type: Conference Paper

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