Life-cycle assessment of semiconductors

Life-Cycle Assessment of Semiconductors

Volumn 9781441999887, Issue , 2012, Pages 1-226

  Boyd, Sarah B ^a  

^a PE International   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLIMATE CHANGE; DYNAMIC RANDOM ACCESS STORAGE; ENVIRONMENTAL TECHNOLOGY; FLASH MEMORY; GLOBAL WARMING; LOGIC DEVICES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICES; SENSITIVITY ANALYSIS; UNCERTAINTY ANALYSIS;

DEGREE OF CONFIDENCE; ENVIRONMENTAL BENEFITS; LIFE CYCLE ASSESSMENT (LCA); PRODUCT TYPES; SEMICONDUCTOR MANUFACTURING; UNCERTAINTY AND SENSITIVITY ANALYSIS;

LIFE CYCLE;

EID: 84949177908     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-4419-9988-7     Document Type: Book

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