Direct comparison of electrical and optical measurements of double rayleigh scatter noise

European Conference on Optical Communication, ECOC

Volumn 3, Issue , 2002, Pages

  Smokovdin, V ^a   Lewis, S A E ^a   Chernikov, S V ^a  

^a Unit 1 Littlemead Ind Est   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC VARIABLES MEASUREMENT; OPTICAL DATA PROCESSING; OPTICAL VARIABLES MEASUREMENT;

OPTICAL MEASUREMENT;

OPTICAL COMMUNICATION;

EID: 84949008308     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. P.B. Hansen et al, IEEE PTL (1997), page 262
2. F.W. Willems et al, Elect. Lett. (1994) page 645
3. S. Burtsev et al, OFC (2002) paper TuR4
4. S.A.E. Lewis et al, (2000), IEEE PTL page 528
5. MO. van Deventer (1993), IEEE JLT, page 1895