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Volumn 6, Issue 4, 2015, Pages 1392-1397

Dispersion compensation in three-photon fluorescence microscopy at 1,700 nm

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION COMPENSATION; FLUORESCENCE MICROSCOPY; GLASS; GROUP VELOCITY DISPERSION; SILICON WAFERS;

EID: 84948780621     PISSN: None     EISSN: 21567085     Source Type: Journal    
DOI: 10.1364/BOE.6.001392     Document Type: Article
Times cited : (43)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.