Technology CAD evaluation of BiCMOS protection structures operation including spatial thermal runaway

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 101-110

  Vashchenko, Vladislav ^a   Concannon, Ann ^a   Ter Beek, Marcel ^a   Hopper, Peter ^a  

^a NSC   (United States)

Author keywords

BiCMOS integrated circuits; Protection

Indexed keywords

ELECTRONIC DESIGN AUTOMATION; ELECTROSTATIC DEVICES; ELECTROSTATIC DISCHARGE; THERMODYNAMIC STABILITY;

3D SIMULATIONS; BICMOS INTEGRATED CIRCUITS; PROTECTION; PROTECTION STRUCTURE; SIMULATION APPROACH; TECHNOLOGY CAD; THERMAL INSTABILITIES; THERMAL RUNAWAYS;

BICMOS TECHNOLOGY;

EID: 84948778506     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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