Effects of ESD transients on the properties of GMR heads

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn 2002-January, Issue , 2002, Pages 123-129

  Granstrom, Eric ^a   Cho, Haeseok ^a   Stokes, Scott ^a   Srun, Seakly ^a   Tabat, Ned ^a  

^a SEAGATE TECHNOLOGY   (United States)

Author keywords

Electrostatic discharge

Indexed keywords

ELECTROSTATIC DISCHARGE; TRANSIENTS;

INDUCED MAGNETIC FIELDS; INDUCING RESISTANCES; LOWER VOLTAGES; PULSEWIDTHS; SHORT PULSE; STEADY STATE; THERMAL FAILURE; VOLTAGE POLARITY;

ELECTROSTATIC DEVICES;

EID: 84948766795     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. L. G. Henry, et al., "Considerations for an HBM ESD Standard for Measuring and Testing of Magnetoresistive Heads," EOS/ESD Symposium, p337, 2000.
2. EOS/ESD Association Standard for ESD Sensitivity Testing (Machine Model), ANSI/EOS/ESD-S5.2-1999.
3. T. Cheung, et al., "Standardized Direct Charge Device ESD Test for Magnetorresistive Recording Heads I," EOS/ESD Symposium, 2002.
4. L. Baril, et al., "Standardized Direct Charge Device ESD Test for Magnetorresistive Recording Heads II," EOS/ESD Symposium, 2002.
5. A. Wallash, "Transmission Line Pulse (TLP) Testing of GMR Recording Heads," EOS/ESD Symposium, p291, 2002.
6. M. Takahashi, et al., "ESD Induced Pinned Layer Reversal in Spin-Valve GMR Heads," IEEE Trans. Magn., vol34, No4, p1522.
7. Y. Shen, et al., "Baseline Popping of Spn-Vavle Recording Heads Induced by ESD," EOS/ESD Symposium, p355, 2000.
8. Ý. Tsu, et al., "Effect of Low-Level ESD on the Lifetime of GMR Heads," EOS/ESD Symposium, p187, 2001.
9. D. Guarisco, et al., "ESD Sensitivity of GMR Heads at Variable Pulse Length," EOS/ESD Symposium, p322, 2000.
10. S. Ramaswamy, et al., "Effect of 1nS to 250 mS ESD Transients on GMR Heads," EOS/ESD Symposium, p505, 2000.
11. L. Baril, et al., "Degradation of GMR and TMR Recording Heads Using Very Short Duration ESD Transients," Intermag, 2002.
12. E. Granstrom, et al., "Limitations of the Adiabatic Model for ESD Failure in GMR Structures," EOS/ESD Symposium, p180, 2000.
13. A. Wallash, et al., "A Study of Diode Protection for Giant Magnetoresitive Recording Heads," EOS/ESD Symposium, p385, 1999.
14. A. Wallash, "A Study of Shunt ESD Protection for GMR Recording Heads," EOS/ESD Symposium, p167. 2001.