Defect analysis of sputter grown cupric oxide for optical and electronics application

Journal of Physics D: Applied Physics

Volumn 48, Issue 49, 2015, Pages

  Dalapati, Goutam Kumar ^a   Kajen, Rasanayagam Sivasayan ^a   Masudy Panah, Saeid ^a   Sonar, Prashant ^a,b  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b QUEENSLAND UNIVERSITY OF TECHNOLOGY   (Australia)

Author keywords

cupric oxide; defect density; sputter grown

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; DEFECTS; ENERGY GAP; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; QUALITY CONTROL; SEMICONDUCTOR DOPING; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ABSORPTION CO-EFFICIENT; CRYSTAL QUALITIES; CUPRIC OXIDE; ELECTRONIC APPLICATION; ELECTRONIC DEVICE; ELECTRONICS APPLICATIONS; TRANSMISSION ELECTRON; WORKING PRESSURES;

DEFECT DENSITY;

EID: 84947976702     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/48/49/495104     Document Type: Article

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