Investigation of the Interaction between Perovskite Films with Moisture via in Situ Electrical Resistance Measurement

ACS Applied Materials and Interfaces

Volumn 7, Issue 45, 2015, Pages 25113-25120

  Hu, Long ^a   Shao, Gang ^b   Jiang, Tao ^b   Li, Dengbing ^a   Lv, Xinlin ^b   Wang, Hongya ^b   Liu, Xinsheng ^a   Song, Haisheng ^a   Tang, Jiang ^a   Liu, Huan ^b  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

degradation; electrical resistance; hydration; moisture; perovskite films

Indexed keywords

DEGRADATION; ELECTRIC RESISTANCE; ELECTRIC RESISTANCE MEASUREMENT; ELECTRIC VARIABLES MEASUREMENT; HYDRATION; MOLECULES; OPTOELECTRONIC DEVICES; PEROVSKITE; PHOTODEGRADATION; X RAY DIFFRACTION ANALYSIS;

DEGRADATION PROCESS; ELECTRICAL RESISTANCE MEASUREMENT; ELECTRICAL RESISTANCES; HALIDE PEROVSKITES; INTERMEDIATE PHASE; PEROVSKITE FILMS; TIME RESOLVED X-RAY DIFFRACTIONS; WATER MOLECULE;

MOISTURE;

EID: 84947756867     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/acsami.5b06268     Document Type: Article

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