RFID indoor localization based on support vector regression and k-means

IEEE International Symposium on Industrial Electronics

Volumn 2015-September, Issue , 2015, Pages 1418-1423

  Berz, Everton Luis ^a   Tesch, Deivid Antunes ^a   Hessel, Fabiano Passuelo ^a  

^a PONTIFICAL CATHOLIC UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

INDOOR POSITIONING SYSTEMS; INDUSTRIAL ELECTRONICS; USER EXPERIENCE;

INDOOR LOCALIZATION; INDUSTRIAL AUTOMATION; LOCALIZATION ERRORS; MACHINE LEARNING MODELS; MULTI-FREQUENCY TECHNIQUES; PHYSICAL LOCATIONS; STATIONARY OBJECTS; SUPPORT VECTOR REGRESSION (SVR);

SUPPORT VECTOR REGRESSION;

EID: 84947248322     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2015.7281681     Document Type: Conference Paper

References (18)

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