Electrical level of defects in single-layer two-dimensional TiO 2

Scientific Reports

Volumn 5, Issue , 2015, Pages

  Song, X F ^a   Hu, L F ^a   Li, D H ^a   Chen, L ^a   Sun, Q Q ^a   Zhou, P ^a   Zhang, D W ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84946761177     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep15989     Document Type: Article

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