An intrinsically safe electrical tomography system

IEEE International Symposium on Industrial Electronics

Volumn II, Issue , 2003, Pages 946-951

  York, T A ^a   Smit, Q ^a   Davidson, J L ^a   Grieve, B D ^b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b JEALOTT S HILL INTERNATIONAL RESEARCH CENTRE   (United Kingdom)

Author keywords

Certification; Current measurement; Diodes; Electric variables measurement; Image reconstruction; Instruments; Relays; System testing; Tomography; Voltage

Indexed keywords

DIODES; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; ELECTRIC VARIABLES MEASUREMENT; HAZARDS; IMAGE RECONSTRUCTION; INDUSTRIAL ELECTRONICS; INSTRUMENT TESTING; INSTRUMENTS; TOMOGRAPHY; ZENER DIODES;

CERTIFICATION; CROSS SECTIONAL IMAGE; ELECTRICAL CURRENT; ELECTRICAL ISOLATION; ELECTRICAL TOMOGRAPHY; HAZARDOUS ENVIRONMENT; RELAYS; SYSTEM TESTING;

IMAGE PROCESSING;

EID: 84946108130     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2003.1267949     Document Type: Conference Paper

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